Accessing Embedded DfT Instruments with IEEE P1687
Author
Summary, in English
Publishing year
2012
Language
English
Pages
71-76
Publication/Series
IEEE 21st Asian Test Symposium (ATS), 2012
Full text
- Available as PDF - 363 kB
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Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- IEEE P1687 IJTAG
- IEEE 1149.1
- embedded instruments
Conference name
IEEE 21st Asian Test Symposium (ATS)
Conference date
2012-11-20
Conference place
Niigata, Japan
Status
Published
Research group
- Digital ASIC
ISBN/ISSN/Other
- ISSN: 1081-7735
- ISBN: 978-1-4673-4555-2