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Accessing Embedded DfT Instruments with IEEE P1687

Author

Summary, in English

While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.

Publishing year

2012

Language

English

Pages

71-76

Publication/Series

IEEE 21st Asian Test Symposium (ATS), 2012

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • IEEE P1687 IJTAG
  • IEEE 1149.1
  • embedded instruments

Conference name

IEEE 21st Asian Test Symposium (ATS)

Conference date

2012-11-20

Conference place

Niigata, Japan

Status

Published

Research group

  • Digital ASIC

ISBN/ISSN/Other

  • ISSN: 1081-7735
  • ISBN: 978-1-4673-4555-2