Capture Power Reduction for Modular System-on-Chip Test
Author
Publishing year
2009
Language
English
Document type
Conference paper
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
IEEE/VSI VLSI Design and Test Symposium (VDAT)
Conference date
2009-07-08 - 2009-07-10
Conference place
Bangalore, India
Status
Published