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Capture Power Reduction for Modular System-on-Chip Test

Author

Publishing year

2009

Language

English

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

IEEE/VSI VLSI Design and Test Symposium (VDAT)

Conference date

2009-07-08 - 2009-07-10

Conference place

Bangalore, India

Status

Published