Buffer layer free large area bi-layer graphene on SiC(0001)
Author
Summary, in English
The influence of hydrogen exposures on monolayer graphene grown on the silicon terminated SiC(0 0 0 1) surface is investigated using photoelectron spectroscopy (PES), low-energy electron microscopy (LEEM) and micro low-energy electron diffraction (mu-LEED). Exposures to ionized hydrogen are shown to have a pronounced effect on the carbon buffer (interface) layer. Exposures to atomic hydrogen are shown to actually convert/transform the monolayer graphene plus carbon buffer layer to bi-layer graphene, i.e. to produce carbon buffer layer free bi-layer graphene on SiC(0 0 0 1). This process is shown to be reversible, so the initial monolayer graphene plus carbon buffer layer situation is recreated after heating to a temperature of about 950 degrees C. A tentative model of hydrogen intercalation is suggested to explain this single to bi-layer graphene transformation mechanism. Our findings are of relevance and importance for various potential applications based on graphene-SiC structures and hydrogen storage. (C) 2009 Elsevier B.V. All rights reserved.
Department/s
Publishing year
2010
Language
English
Pages
4-7
Publication/Series
Surface Science
Volume
604
Issue
2
Document type
Journal article
Publisher
Elsevier
Topic
- Natural Sciences
- Physical Sciences
Keywords
- LEEM
- Silicon carbide
- Epitaxial
- Graphene
- Bi-layer
- PES
- Hydrogenation
- LEED
Status
Published
ISBN/ISSN/Other
- ISSN: 0039-6028