Scanning tunneling microscope and luminescence nanocharacterization of semiconductor quantum dots
Author
Department/s
Publishing year
2004
Language
English
Publication/Series
Book of extended abstracts: Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited
Document type
Conference paper
Topic
- Condensed Matter Physics
Conference name
Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited
Conference date
0001-01-02
Status
Published