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On Reduction of Capture Power for Modular System-on-Chip Test

Author

Publishing year

2008

Language

English

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • modular system-on-chip
  • testing
  • power reduction

Conference name

IEEE Workshop on RTL and High Level Testing WRTLT08

Conference date

0001-01-02

Status

Published