On Reduction of Capture Power for Modular System-on-Chip Test
Author
Publishing year
2008
Language
English
Document type
Conference paper
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- modular system-on-chip
- testing
- power reduction
Conference name
IEEE Workshop on RTL and High Level Testing WRTLT08
Conference date
0001-01-02
Status
Published