Temperature and frequency characterization of InAs nanowire and HfO2 interface using capacitance-voltage method
Author
Summary, in English
Department/s
Publishing year
2011
Language
English
Pages
444-447
Publication/Series
Microelectronic Engineering
Volume
88
Issue
4
Document type
Conference paper
Publisher
Elsevier
Topic
- Condensed Matter Physics
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- III/V
- Nanowire doping
- Capacitance-voltage
- InAs
- Vertical wrap gate
Conference name
EMRS 2010 Spring Meeting on Post-Si-CMOS Electronic Devices - The Role of Ge and III-V Materials
Conference date
2010-06-07 - 2010-06-11
Conference place
Strasbourg, France
Status
Published
Research group
- Nano
ISBN/ISSN/Other
- ISSN: 1873-5568
- ISSN: 0167-9317