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Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC

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Author

  • Jaynarayan T. Tudu
  • Erik Larsson
  • Virendra Singh
  • Hideo Fujiwara

Publishing year

2009

Language

English

Pages

43-48

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

10th IEEE Workshop on RTL and High Level Testing (WRTLT'09)

Conference date

2009-11-27 - 2009-11-28

Conference place

Hongkong, China

Status

Published