A Technique for Test Infrastructure Design and Test Scheduling
Author
Summary, in English
Publishing year
2000
Language
English
Pages
26-26
Publication/Series
[Host publication title missing]
Links
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- testing
- simulated annealing
- test scheduling
- test bus infrastructure
Conference name
Design and Diagnostic of Electronic Circuits and Systems Workshop DDECS
Conference date
0001-01-02
Status
Published