A Distributed Architecture to Check Global Properties for Post-Silicon Debug
Author
Summary, in English
Publishing year
2010
Language
English
Publication/Series
Test Symposium (ETS), 2010 15th IEEE European
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
IEEE European Test Symposium (ETS'10), 2010
Conference date
2010-05-24 - 2010-05-28
Conference place
Prague, Czech Republic
Status
Published
ISBN/ISSN/Other
- ISBN: 978-1-4244-5834-9