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High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO

På svenska

Author

  • Tobias Dubois
  • Mohamed Azimane
  • Erik Larsson
  • Erik Jan Marinissen
  • Paul Wielage
  • Clemens Wouters

Publishing year

2006

Language

English

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • testing
  • design for testability
  • embedded systems
  • FIFO

Conference name

14th Philips Research IC Test Seminar

Conference date

0001-01-02

Status

Published