UWB channel measurements in an industrial environment
Author
Summary, in English
Publishing year
2004
Language
English
Pages
3511-3516
Publication/Series
[Host publication title missing]
Full text
- Available as PDF - 977 kB
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Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- ultra-wideband channels
- factory hall
- small-scale fading statistics
- virtual arrays
- UWB directional analysis
- metallic scatterers
- dense multipath scattering
- power delay profile
- NLOS
- delay spreads
- LOS
- UWB channel measurements
- multiple scatterer clusters
- industrial environment
- 30 to 40 ns
Conference name
IEEE Global Communications Conference (GLOBECOM), 2004
Conference date
2004-11-29 - 2004-12-03
Conference place
Dallas, TX, United States
Status
Published
ISBN/ISSN/Other
- ISBN: 0-7803-8794-5