Design and Modeling of a High-Speed AFM-Scanner
Author
Summary, in English
A new mechanical scanner design for a high-speed atomic force microscope (AFM) is presented and discussed in terms of modeling and control. The positioning range of this scanner is 13 mum in the X- and Y-directions and 4.3 mum in the vertical direction. The lowest resonance frequency of this scanner is above 22 kHz. This paper is focused on the vertical direction of the scanner, being the crucial axis of motion with the highest precision and bandwidth requirements for gentle imaging with the AFM. A second- and a fourth-order mathematical model of the scanner are derived that allow new insights into important design parameters. Proportional-integral (Pl)-feedback control of the high-speed scanner is discussed and the performance of the new AFM is demonstrated by imaging a calibration grating and a biological sample at 8 frames/s.
Department/s
Publishing year
2007
Language
English
Pages
906-915
Publication/Series
IEEE Transactions on Control Systems Technology
Volume
15
Issue
5
Document type
Journal article
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Control Engineering
Keywords
- Atomic force microscopy
- fast scanning
- mechatronics
- nanotechnology
- precision positioning
- real time imaging
Status
Published
ISBN/ISSN/Other
- ISSN: 1558-0865