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Test Scheduling of Modular System-on-Chip under Capture Power Constraint

Author

Publishing year

2010

Language

English

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

IEEE Eleventh Workshop on RTL and High Level Testing, 2010

Conference date

2010-12-05 - 2012-12-06

Conference place

Shanghai, China

Status

Published