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Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam

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Author

  • J. Gaudin
  • B. Keitel
  • Andrius Jurgilaitis
  • Ralf Nüske
  • L. Guerin
  • Jörgen Larsson
  • K. Mann
  • B. Schaefer
  • K. Tiedtke
  • A. Trapp
  • Th Tschentscher
  • F. Yang
  • M. Wulff
  • H. Sinn
  • B. Floeter
Show all

Summary, in English

We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials. (C) 2011 Optical Society of America

Department/s

Publishing year

2011

Language

English

Pages

15516-15524

Publication/Series

Optics Express

Volume

19

Issue

16

Document type

Journal article

Publisher

Optical Society of America

Topic

  • Atom and Molecular Physics and Optics

Status

Published

ISBN/ISSN/Other

  • ISSN: 1094-4087