X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level
Author
Summary, in English
Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.
Department/s
Publishing year
1970
Language
English
Pages
141-143
Publication/Series
Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume
84
Issue
1
Document type
Journal article
Publisher
Elsevier
Topic
- Subatomic Physics
- Production Engineering, Human Work Science and Ergonomics
Keywords
- PIXE
- particle induced X-ray emission analysis
- trace element analysis
Status
Published
ISBN/ISSN/Other
- ISSN: 0167-5087