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Designing and Modeling of a High-Speed Scanner for Atomic Force Microscopy

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Author

  • G. Schitter
  • Karl Johan Åström
  • B. DeMartini
  • G.E. Fantner
  • Ph. J. Thurner
  • K.J. Turner
  • P.K. Hansma

Publishing year

2006

Language

English

Document type

Conference paper

Topic

  • Control Engineering

Conference name

American Control Conference, 2006

Conference date

2006-06-14 - 2006-06-16

Conference place

Minneapolis, Minnesota, United States

Status

Published