Direct atomically resolved imaging inside a nanowire
Author
Publishing year
2004
Language
English
Publication/Series
Book of extended abstracts: Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)
Document type
Conference paper
Topic
- Atom and Molecular Physics and Optics
- Condensed Matter Physics
Conference name
Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)
Conference date
0001-01-02
Status
Published