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Direct atomically resolved imaging inside a nanowire

Author

Publishing year

2004

Language

English

Publication/Series

Book of extended abstracts: Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)

Document type

Conference paper

Topic

  • Atom and Molecular Physics and Optics
  • Condensed Matter Physics

Conference name

Intl Conf on Scanning Probe Microscopy, Sensors and Nanostruct, Beijing, China (2004)

Conference date

0001-01-02

Status

Published