Detection of duplicate defect reports using natural language processing
Author
Summary, in English
Publishing year
2007
Language
English
Pages
499-508
Publication/Series
Proceedings - International Conference on Software Engineering
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Computer Science
Keywords
- Sony Ericsson (CO)
- User testing
Conference name
29th International Conference on Software Engineering, ICSE 2007
Conference date
2007-05-20 - 2007-05-26
Conference place
Minneapolis, MN, United States
Status
Published
ISBN/ISSN/Other
- ISSN: 0270-5257
- CODEN: PCSEDE