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Deterministic Scan-Chain Diagnosis for Intermittent Faults

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Author

  • Dan Adolfsson
  • Joanna Siew
  • Erik Larsson
  • Erik Jan Marinissen

Publishing year

2009

Language

English

Publication/Series

European Test Symposium (ETS 2009)

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

European Test Symposium, ETS 2009

Conference date

2009-05-25 - 2009-05-29

Conference place

Sevilla, Spain

Status

Published