The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Practical product importance sampling for direct illumination

Author

Editor

  • Roberto Scopigno
  • Eduard Gröller

Summary, in English

We present a practical algorithm for sampling the product of environment map lighting and surface reflectance.

Our method builds on wavelet-based importance sampling, but has a number of important advantages over previous methods. Most importantly, we avoid using precomputed reflectance functions by sampling the BRDF on-the-fly. Hence, all types of materials can be handled, including anisotropic and spatially varying BRDFs, as well

as procedural shaders. This also opens up for using very high resolution, uncompressed, environment maps. Our

results show that this gives a significant reduction of variance compared to using lower resolution approximations. In addition, we study the wavelet product, and present a faster algorithm geared for sampling purposes.

For our application, the computations are reduced to a simple quadtree-based multiplication. We build the BRDF

approximation and evaluate the product in a single tree traversal, which makes the algorithm both faster and more

flexible than previous methods.

Publishing year

2008

Language

English

Pages

681-690

Publication/Series

Computer Graphics Forum

Volume

27

Issue

2

Document type

Conference paper

Publisher

Wiley-Blackwell

Topic

  • Computer Science

Keywords

  • Ray tracing
  • Photo-realistic rendering
  • Computer graphics
  • Importance sampling

Conference name

Eurographics 2008

Conference date

2008-04-14

Conference place

Crete, Greece

Status

Published

Research group

  • Computer Graphics

ISBN/ISSN/Other

  • ISSN: 0167-7055
  • ISSN: 1467-8659