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Statistical analysis of the UWB channel in an industrial environment

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Author

Summary, in English

In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy

Publishing year

2004

Language

English

Pages

81-85

Publication/Series

[Host publication title missing]

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • metallic scatterers
  • industrial environment
  • dense multipath scattering
  • nonline-of-sight scenarios
  • 3.1 to 10.6 GHz
  • ray power decay constants
  • UWB channel
  • power delay profile
  • statistical analysis
  • Saleh-Valenzuela model
  • Rayleigh distributed small-scale fading signal
  • Nakagami distributions
  • factory hall

Conference name

IEEE Vehicular Technology Conference (VTC2004-fall)

Conference date

2004-09-26 - 2004-09-29

Conference place

Los Angeles, CA, United States

Status

Published

ISBN/ISSN/Other

  • ISBN: 0-7803-8521-7