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Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

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Summary, in English

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

Publishing year

2010

Language

English

Publication/Series

New Journal of Physics

Volume

12

Document type

Journal article

Publisher

IOP Publishing

Topic

  • Condensed Matter Physics
  • Electrical Engineering, Electronic Engineering, Information Engineering

Status

Published

Research group

  • Nano

ISBN/ISSN/Other

  • ISSN: 1367-2630