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Wavelet Importance Sampling: Efficiently Evaluating Products of Complex Functions

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Author

Summary, in English

We present a new technique for importance sampling products of complex functions using wavelets. First, we generalize previous work on wavelet products to higher dimensional spaces and show how this product can be sampled on-the-fly without the need of evaluating the full product. This makes it possible to sample products of high-dimensional functions even if the product of the two functions in itself is too memory consuming. Then, we present a novel hierarchical sample warping algorithm that generates high-quality point distributions, which match the wavelet representation exactly. One application of the new sampling technique is rendering of objects with measured BRDFs illuminated by complex distant lighting - our results demonstrate how the new sampling technique is more than an order of magnitude more efficient than the best previous techniques. Copyright

Publishing year

2005

Language

English

Pages

1166-1175

Publication/Series

ACM Transactions on Graphics

Volume

24

Issue

3

Document type

Conference paper

Publisher

Association for Computing Machinery (ACM)

Topic

  • Computer Science

Keywords

  • Complex products
  • Monte Carlo techniques
  • Global illumination
  • Rendering
  • Wavelets
  • Importance sampling

Conference name

32th International Conference on Computer Graphics and Interactive Techniques, 2005

Conference date

2005-07-31 - 2005-08-04

Conference place

Los Angeles, CA, United States

Status

Published

ISBN/ISSN/Other

  • ISSN: 0730-0301