SOC Test Scheduling with Test Set Sharing and Broadcasting
Author
Summary, in English
Publishing year
2005
Language
English
Pages
162-162
Publication/Series
[Host publication title missing]
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- testing
- system-on-chip
- test scheduling
- overlapping test patterns
- constraint logic programming
Conference name
IEEE Asian Test Symposium
Conference date
2005-12-18 - 2005-12-21
Conference place
Calcutta, India
Status
Published