The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

A 3.6mW, 90nm CMOS Gated-Vernier Time-to-Digital Converter with an Equivalent Resolution of 3.2ps

Author

Summary, in English

Two gated ring oscillators (GROs) act as the delay lines in an improved Vernier time-to-digital converter (TDC), where the already small quantization noise of the standard Vernier TDC is further first-order shaped by the GRO operation. The TDC has been implemented in a 90nm CMOS process and consumes 3mA from 1.2V when operating at 25MHz. The native Vernier resolution of the TDC is 5.8ps, while the total noise integrated over a bandwidth of 800kHz yields an equivalent TDC resolution of 3.2ps.

Publishing year

2012

Language

English

Pages

1626-1635

Publication/Series

IEEE Journal of Solid-State Circuits

Volume

47

Issue

7

Document type

Journal article

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • Gated Ring Oscillator
  • Time-to-Digital Converter
  • Vernier Delay Line

Status

Published

ISBN/ISSN/Other

  • ISSN: 0018-9200