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An Even-Odd DFD Technique for Scan Chain Diagnosis

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Author

Publishing year

2009

Language

English

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Conference name

Workshop on RTL and High Level Testing (WRTLT)

Conference date

2009-11-27 - 2009-11-28

Conference place

Hongkong, China

Status

Published