X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution

Summary, in English

Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.

• Author: A. M. Lindenberg; S. Engemann; K. J. Gaffney; K. Sokolowski-Tinten; Jörgen Larsson; P. B. Hillyard; D. A. Reis; D. M. Fritz; J. Arthur; R. A. Akre; M. J. George; A. Deb; P. H. Bucksbaum; J. Hajdu; D. A. Meyer; M. Nicoul; C. Blome; Th. Tschentscher; A. L. Cavalieri; R. W. Falcone; S. H. Lee; R. Pahl; J. Rudati; P. H. Fuoss; A. J. Nelson; P. Krejcik; D. P. Siddons; P. Lorazo; J. B. Hastings
• Department/s: Atomic Physics
• Publishing year: 2008
• Language: English
• Publication/Series: Physical Review Letters
• Volume: 100
• Issue: 13
• Links: http://dx.doi.org/10.1103/PhysRevLett.100.135502
• Document type: Journal article
• Publisher: American Physical Society
• Topic: Atom and Molecular Physics and Optics
• Status: Published
• ISBN/ISSN/Other: ISSN: 1079-7114