A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing
Author
Summary, in English
Publishing year
2007
Language
English
Pages
61-61
Publication/Series
[Host publication title missing]
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- testing
- system-on-chip
- memory reduction
- test scheduling
- test data compression
- test sharing
- tabu search
Conference name
IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2007
Conference date
2007-04-11 - 2007-04-13
Conference place
Krakow, Poland
Status
Published
Research group
- Digital ASIC
ISBN/ISSN/Other
- ISBN: 1-4244-1162-9