An Efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling
Author
Summary, in English
Publishing year
2003
Language
English
Pages
51-56
Publication/Series
[Host publication title missing]
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- test application time
- system-on-chip
- SOC
- wrapper
- test access mechanism
- TAM
- P1500 restrictions
- TestBus architecture
- test conflicts
Conference name
IEEE European Test Workshop 2003 ETW03
Conference date
2003-05-25 - 2003-05-28
Conference place
Maastricht, Netherlands
Status
Published
ISBN/ISSN/Other
- ISSN: 1530-1877
- ISBN: 0-7695-1908-3