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Shear stress measurements on InAs nanowires by AFM manipulation

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Author

Publishing year

2007

Language

English

Pages

1398-1401

Publication/Series

Small

Volume

3

Issue

8

Document type

Journal article

Publisher

John Wiley & Sons Inc.

Topic

  • Nano Technology

Keywords

  • deformation
  • indium arsenide
  • atomic force microscopy
  • nanowires

Status

Published

ISBN/ISSN/Other

  • ISSN: 1613-6829