Investigating Test Teams' Defect Detection in Function Test
Author
Summary, in English
Publishing year
2007
Language
English
Pages
458-460
Publication/Series
ESEM07 - First International Symposium on Empirical Software Engineering and Measurement, September, 20-21, 2007, Madrid, Spain
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Computer Science
Conference name
First International Symposium on Empirical Software Engineering and Measurement
Conference date
2007-09-20 - 2007-09-21
Conference place
Madrid, Spain
Status
Published
ISBN/ISSN/Other
- ISSN: 1938-6451
- ISBN: 978-0-7695-2886-1