A 500 fW/bit 14 fJ/bit-access 4kb Standard-Cell Based Sub-VT Memory in 65nm CMOS
Author
Publishing year
2012
Language
English
Pages
321-324
Publication/Series
2012 Proceedings of the ESSCIRC (ESSCIRC)
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Conference name
ESSIRC 2012
Conference date
2012-09-17 - 2012-09-21
Conference place
Bordeaux, France
Status
Published
ISBN/ISSN/Other
- ISBN: 978-1-4673-2212-6