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Proton-Induced X-ray Emission Spectroscopy in Elemental Trace Analysis

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Author

Summary, in English

Using protons in the MeV range as excitation source and a high resolution Si(Li) detector,X-ray emission spectroscopy is shown to be capable of analyzing many elements with Z > 15 simultaneously at the 10-12 g level. This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.

Publishing year

1972

Language

English

Pages

373-387

Publication/Series

Advances in X-Ray Analysis

Volume

15

Document type

Journal article

Publisher

International Centre for Diffraction Data

Topic

  • Production Engineering, Human Work Science and Ergonomics
  • Subatomic Physics

Keywords

  • PIXE
  • particle induced x-ray emission analysis
  • trace element analysis

Status

Published