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Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO

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Author

  • Tobias Dubois
  • Erik Jan Marinissen
  • Mohamed Azimane
  • Paul Wielage
  • Erik Larsson
  • Clemens Wouters

Summary, in English

Embedded First-InFirst-Out (FIFO) memories are increasingly used in many IC designs.We have created a new full-custom embedded FIFO module withasynchronous read and write clocks, which is at least a factor twosmaller and also faster than SRAM-based and standard-cell-basedcounterparts. The detection qualities of the FIFO test for bothhard and weak resistive shorts and opens have been analyzed by anIFA-like method based on analog simulation. The defect coverage ofthe initial FIFO test for shorts in the bit-cell matrix has beenimproved by inclusion of an additional data background andlow-voltage testing; for low-resistant shorts, 100% defect coverageis obtained. The defect coverage for opens has been improved by anew test procedure which includes waitingperiods.

Publishing year

2007

Language

English

Pages

859-859

Publication/Series

[Host publication title missing]

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • embedded systems
  • testing
  • FIFO
  • memory
  • test quality analysis

Conference name

Design, Automation, and Test in Europe DATE

Conference date

2007-04-16 - 2007-04-20

Conference place

Nice, France

Status

Published

Research group

  • Digital ASIC

ISBN/ISSN/Other

  • ISBN: 978-3-9810801-2-4