Protocol Requirements in an SJTAG/IJTAG Environment
Author
Summary, in English
Publishing year
2007
Language
English
Pages
1-3
Publication/Series
[Host publication title missing]
Document type
Conference paper
Publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Keywords
- testing
- Integrated Circuits
- Printed Circuits Boards
- Multi-board systems
- test protocol
Conference name
International Test Conference, 2007
Conference date
2007-10-21 - 2007-10-26
Conference place
Santa Clara, CA, United States
Status
Published
Research group
- Digital ASIC
ISBN/ISSN/Other
- ISSN: 1089-3539
- ISBN: 978-1-4244-1127-6