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AFM-based manipulation of InAs nanowires

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Author

Summary, in English

A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the 'Retrace Lift' mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.

Publishing year

2008

Language

English

Pages

052051-052051

Publication/Series

Journal of Physics: Conference Series

Volume

100

Document type

Conference paper

Publisher

IOP Publishing

Topic

  • Condensed Matter Physics

Conference name

17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology

Conference date

2007-07-02 - 2007-07-06

Conference place

Stockholm, Sweden

Status

Published

ISBN/ISSN/Other

  • ISSN: 1742-6588
  • ISSN: 1742-6596