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SOC Test Optimization with Compression-Technique Selection

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Author

  • Anders Larsson
  • Xin Zhang
  • Erik Larsson
  • Krishnendu Chakrabarty

Publishing year

2008

Language

English

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • systems-on-chip
  • testing
  • compression

Conference name

A Workshop in Conjunction with the International Test Conference

Conference date

0001-01-02

Status

Published