The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Analysis of InAs/HfO2 nanowire CV characteristics

På svenska

Author

Publishing year

2010

Language

English

Document type

Conference paper

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering
  • Condensed Matter Physics

Conference name

EMRS 2010 Spring Meeting on Post-Si-CMOS Electronic Devices - The Role of Ge and III-V Materials

Conference date

2010-06-07 - 2010-06-11

Conference place

Strasbourg, France

Status

Published

Research group

  • Nanometer structure consortium (nmC)
  • Nano