A comparative study of clean and Bi-stabilized InP(100)(2 x 4) surfaces by the core-level photoelectron spectroscopy

Summary, in English

The bismuth-stabilized (2 x 4)-reconstructed InP(100) surface [Bi/InP(100)(2 x 4)] has been studied by synchrotron-radiation core-level photoelectron spectroscopy. The spectra are compared with previous core-level data obtained on a clean InP(100)(2 x 4) surface. The findings support that the P 2p surface-core-level shift (SCLS) of the clean InP(100)(2 x 4), which has higher kinetic energy than the bulk emission, arises from the third-layer P atoms and that the second P 2p SCLS, which has lower kinetic energy than the bulk, arises from the top-layer P atoms. Similar In 4d SCLSs are found on the clean and Bi-stabilized InP(100)(2 x 4) surfaces, indicating that these shifts contain contributions of the In atoms that lie in the second and/or fourth layers. In addition to this, the results improve our understanding of the atomic structure of the Bi/InP(100)(2 x 4) surface and lead to refined surface models which include Bi-Bi and Bi-P dimers. (C) 2007 Elsevier B.V. All rights reserved.

• Author: P. Laukkanen; M. Ahola-Tuomi; Johan Adell; Martin Adell; K. Schulte; M. Kuzmin; M. P. J. Punkkinen; J. Pakarinen; A. Tukiainen; R. E. Perala; I. J. Vayrynen; M. Pessa
• Department/s: MAX IV Laboratory
• Publishing year: 2007
• Language: English
• Pages: 3395-3399
• Publication/Series: Surface Science
• Volume: 601
• Issue: 16
• Links: http://dx.doi.org/10.1016/j.susc.2007.06.013
• Document type: Journal article
• Publisher: Elsevier
• Topic: Physical Sciences; Natural Sciences
• Keywords: synchrotron radiation photoelectron spectroscopy; (InP); indium phosphide; single crystal surfaces; surface reconstruction
• Status: Published
• ISBN/ISSN/Other: ISSN: 0039-6028