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Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances

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Author

  • C. J. Glover
  • T. Schmitt
  • M. Mattesini
  • M. Adell
  • L. Ilver
  • J. Kanski
  • Lisbeth Kjeldgaard
  • M. Agaker
  • Nils Mårtensson
  • R. Ahuja
  • J. Nordgren
  • J. -E. Rubensson
Show all

Summary, in English

Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics. (c) 2009 Elsevier B.V. All rights reserved.

Department/s

Publishing year

2009

Language

English

Pages

103-107

Publication/Series

Journal of Electron Spectroscopy and Related Phenomena

Volume

173

Issue

2-3

Document type

Journal article

Publisher

Elsevier

Topic

  • Physical Sciences
  • Natural Sciences

Keywords

  • Spectroscopy
  • Semiconductors
  • Soft X-ray scattering (RIXS)
  • Ultrafast dynamics
  • Synchrotron radiation

Status

Published

ISBN/ISSN/Other

  • ISSN: 0368-2048