Reduced impact of induced gate noise on inductively degenerated LNAs in deep submicron CMOS technologies
Author
Summary, in English
Designers of radio-frequency inductively-degenerated CMOS low-noise-amplifiers have usually not followed the guidelines for achieving minimum noise figure. Nonetheless, state-of-the- art implementations display noise figure values very close to the theoretical minimum. In this paper, we point out that this is due to the effect of the parasitic overlap capacitances in the MOS device. In particular, we show that overlap capacitances lead to a significant induced-gate-noise reduction, especially when deep sub-micron CMOS processes are used.
Publishing year
2005
Language
English
Pages
31-36
Publication/Series
Analog Integrated Circuits and Signal Processing
Volume
42
Issue
1
Links
Document type
Journal article
Publisher
Springer
Topic
- Electrical Engineering, Electronic Engineering, Information Engineering
Status
Published
ISBN/ISSN/Other
- ISSN: 0925-1030