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Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

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Author

  • M Lundwall
  • Maxim Tchaplyguine
  • G Ohrwall
  • A Lindblad
  • Sergey Peredkov
  • T Rander
  • S Svensson
  • O Bjorneholm

Summary, in English

The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.

Publishing year

2005

Language

English

Pages

12-19

Publication/Series

Surface Science

Volume

594

Issue

1-3

Document type

Journal article

Publisher

Elsevier

Topic

  • Natural Sciences
  • Atom and Molecular Physics and Optics
  • Physical Sciences

Keywords

  • photoelectron
  • Auger ejection
  • photoelectron spectroscopy
  • spectroscopy
  • Auger electron
  • surface sensitivity
  • effective attenuation length-
  • synchrotron radiation photoelectron spectroscopy
  • emission

Status

Published

ISBN/ISSN/Other

  • ISSN: 0039-6028