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Abort-on-Fail Based Test Scheduling

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Author

Summary, in English

The long andincreasing test application time for modular core-basedsystem-on-chips is a major problem, and many approaches have beendeveloped to deal with the problem. Different from previousapproaches, where it is assumed that all tests will be performeduntil completion, we consider the cases where the test process isterminated as soon as a defect is detected. Such abort-on-failtesting is common practice in production test of chips. We define amodel to compute the expected test time for a given test schedulein an abort-on-fail environment. We have implemented threescheduling techniques and the experimental results show asignificant test time reduction (up to 90%) when making use of anefficient test scheduling technique that takes defect probabilitiesinto account.

Publishing year

2005

Language

English

Pages

651-658

Publication/Series

Journal of Electronic Testing

Volume

21

Issue

6

Document type

Journal article

Publisher

Springer

Topic

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • testing
  • test scheduling
  • abort-on-fail

Status

Published

ISBN/ISSN/Other

  • ISSN: 0923-8174