New Flexible Toolbox for Nanomechanical Measurements with Extreme Precision and at Very High Frequencies.

Summary, in English

We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.

• Author: Alexander Fian; Monica Lexholm; Rainer Timm; Bernhard Mandl; Ulf Håkanson; Dan Hessman; Edvin Lundgren; Lars Samuelson; Anders Mikkelsen
• Department/s: Solid State Physics; Synchrotron Radiation Research; NanoLund: Centre for Nanoscience
• Publishing year: 2010
• Language: English
• Pages: 3893-3898
• Publication/Series: Nano Letters
• Volume: 10
• Issue: Online August 26, 2010
• Links: http://dx.doi.org/10.1021/nl1015427
• Document type: Journal article
• Publisher: The American Chemical Society (ACS)
• Topic: Nano Technology
• Status: Published
• ISBN/ISSN/Other: ISSN: 1530-6992