The c-axis thermal conductivity of graphite film of nanometer thickness measured by time resolved X-ray diffraction

Summary, in English

We report on the use of time resolved X-ray diffraction to measure the dynamics of strain in laser-excited graphite film of nanometer thickness, obtained by chemical vapour deposition (CVD). Heat transport in the CVD film is simulated with a 1-dimensional heat diffusion model. We find the experimental data to be consistent with a c-axis thermal conductivity of similar to 0.7 Wm(-1) K-1. This value is four orders of magnitude lower than the thermal conductivity in-plane, confirming recent theoretical calculations of the thermal conductivity of multilayer graphene. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4769214]

• Author: Maher Harb; Clemens von Korff Schmising; Henrik Enquist; Andrius Jurgilaitis; Ivan Maximov; P. V. Shvets; A. N. Obraztsov; D. Khakhulin; M. Wulff; Jörgen Larsson
• Department/s: Atomic Physics; Solid State Physics; NanoLund: Centre for Nanoscience
• Publishing year: 2012
• Language: English
• Publication/Series: Applied Physics Letters
• Volume: 101
• Issue: 23
• Links: http://dx.doi.org/10.1063/1.4769214
• Document type: Journal article
• Publisher: American Institute of Physics (AIP)
• Topic: Condensed Matter Physics; Atom and Molecular Physics and Optics
• Status: Published
• ISBN/ISSN/Other: ISSN: 0003-6951