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Shear anisotropy in Si-Cu interfaces on the atomic scale

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Author

Department/s

Publishing year

2016

Language

English

Publication/Series

Computational Materials Science

Document type

Journal article

Publisher

Elsevier

Topic

  • Mechanical Engineering

Keywords

  • copper coated silicon, nanosized film, lattice orientation, molecular dynamics, anisotropy, slip-direction

Status

Submitted

Project

  • Atomistic Studies of Nanosized Copper Structures

ISBN/ISSN/Other

  • ISSN: 0927-0256