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Multifrequency Test and Diagnosis of Analog Circuits Using Constraint Programming and Interval Arithmetic

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Author

  • Ana Fuentes
  • Krzysztof Kuchcinski

Summary, in English

Analog circuits are often specified using non-linear equations, which are difficult to analyze. Therefore, test generation and diagnosis are problematic issues in practice. In this paper we propose a new method for diagnosis of analog circuits that uses combined information from tests at different frequencies. By solving simultaneously the resulting equations (one for each test frequency), we get a reliable method that decreases the number of possible answers to the diagnosis

problem. The min-max optimization algorithm that we implemented for non-linear transfer functions gives good average runtime for diagnosis parametric

faults.

Publishing year

2003

Language

English

Publication/Series

Proceedings of the IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Document type

Conference paper

Topic

  • Computer Science

Conference name

IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2003

Conference date

2003-04-14 - 2003-04-16

Conference place

Poznan, Poland

Status

Published