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X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.

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Author

Summary, in English

The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.

Publishing year

2015

Language

English

Pages

59-66

Publication/Series

Journal of Synchrotron Radiation

Volume

22

Issue

Pt 1

Document type

Journal article

Publisher

International Union of Crystallography

Topic

  • Accelerator Physics and Instrumentation

Status

Published

ISBN/ISSN/Other

  • ISSN: 1600-5775