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Accessing On-chip Instruments Through the Life-time of Systems

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Author

Summary, in English

The electronic systems we find in almost every product today are implemented using integrated circuits (ICs) mounted on printed circuit boards (PCBs). Developing electronic systems is a challenging task due to complexity and miniaturization. A single IC can contain billions of transistors, which are smaller than ever. As a result more Design-for-Test (DfT) features, so called instruments, are embedded on-chip in modern ICs to handle and monitor various activities. Many defects are handled at IC manufacturing; however, there are many problems occurring after ICs are being mounted on PCBs. In many cases, it is unfortunately not possible to reproduce the problem when the electronic system is taken to a repair shop. These problems are known as No Trouble Found (NTF). One obstacle is the limited access to the on-chip DfT instruments that exist in most ICs. We will discuss access to on-chip DfT instruments through the life-time of electronic systems. We will focus on electronic systems using the IEEE 1687 standard.

Publishing year

2016-06-01

Language

English

Pages

2-4

Publication/Series

LATS 2016 - 17th IEEE Latin-American Test Symposium

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Other Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • access time
  • DFT instrument
  • IEEE Std. 1687
  • Security

Conference name

LATS 2016 17th IEEE Latin-American Test Symposium

Conference date

2016-04-06 - 2016-04-09

Conference place

Foz do Iguacu, Brazil

Status

Published

ISBN/ISSN/Other

  • ISBN: 9781509013319