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Time resolved X-ray studies in semiconductor nanostructures

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Author

Summary, in English

Time resolved X-ray diffraction has been used to study acoustic oscillations in InAs/Sb nanowires with diameters of 80 nm and 40 nm in order to determine the speed of sound in the wires.

Department/s

Publishing year

2012

Language

English

Publication/Series

2012 Conference on Lasers and Electro-Optics (Cleo)

Document type

Conference paper

Publisher

IEEE - Institute of Electrical and Electronics Engineers Inc.

Topic

  • Atom and Molecular Physics and Optics

Conference name

Conference on Lasers and Electro-Optics (CLEO)

Conference date

2012-05-06 - 2012-05-11

Status

Published

ISBN/ISSN/Other

  • ISBN: 978-1-55752-933-6